Circuit having a Local Power Block for Leakage Reduction

ABSTRACT

A circuit having a local power block for leakage reduction is disclosed. The circuit has a first portion and a second portion. The first portion is configured to operate at a substantially greater operating frequency than the operating frequency of the second portion. The second portion has a local power block configured to decouple the second portion if the second portion is inactive to reduce leakage current associated with the second portion without sacrificing performance of the first portion.

FIELD OF DISCLOSURE

The present disclosure relates generally to methods and systems forreducing leakage current in circuit design, and more specifically, tomethods and systems for reducing leakage current in low activitycircuitry while maintaining the performance of high activity circuitry.

BACKGROUND

With feature size becoming smaller in circuit design, power leakage isbecoming a more significant portion of the overall power consumed by acircuit, such as a sequential circuit. Power leakage in circuit designis an important issue, particularly because power leakage can accountfor a significant proportion of the total power for an IC.

For example, FIG. 1 illustrates a conventional device (e.g., inverter)100 having an input a, an output nz, a voltage source, and ground. Acapacitor 102 is charged by the supply current Vdd. Theoretically, oncethe capacitor 102 is charged, there will be no current flowing throughthe circuit and there will be no power leakage through the circuit.However, this may not be true in practice, since devices may leak. Eventhough a device is supposed to be turned off or inactive there can stillbe some current flowing/leakage through the device. Hence, there will bepower leakage through the device.

This problem becomes more prevalent as technology shrinks and becomesfaster. The smaller and faster the circuits are designed to operate, thegreater the leakage. Thus, as the circuit density increases the leakagedue to the increased devices also increases. It is desirable to reducesuch leakage because it is occurring all the time irrespective ofwhether the device is performing an activity, or whether the centralprocessing unit (CPU) of the device is on or off. As long as there is apower supply connected to the circuit, leakage can be occurring. Thus,leakage can account for a significant portion of the overall powerconsumed by an integrated circuit (IC) in an inactive state or with asignificant number of inactive circuits.

This is not as much of a problem during activity, when the dynamic poweris greater. However, if no activity is being performed, then the dynamicpower is less (e.g., it may be zero). Thus, in an inactive state, theleakage current will dominate the total power of the IC. This isparticularly problematic with battery powered devices in which the powersupply is limited.

In low power circuit designs, it is desired to minimize the leakagecurrent without sacrificing performance. For example, conventionally, adevice can be added to the overall circuit to block the path from thevoltage source to the circuit, or the path from the circuit to theground, in order to limit or reduce the leakage through the circuit. Inone conventional system, a global header or global footer is added inthe power supply path from the voltage source to the circuit to limitthe leakage. In other words, the power source is decoupled from thecircuit to reduce leakage during inactivity of the circuits. A globalheader is a decoupling device that is coupled between Vdd and thecircuit, while a footer is a decoupling device that is coupled betweenthe circuit and Vss.

However, conventional global headers/footers have to be scaled to passand control large currents and use additional control signals that areconnected to numerous locations in the circuit design. Such designrequirements result in increased costs, for example, in terms of areaoccupied by the circuit on the IC and increased routing complexity. Suchconventional designs also may reduce the performance of the IC, forexample, by reducing the speed of the circuit and reducing performance,as described in more detail below.

A high threshold voltage (high V_(T), or HV_(T)) device is used in theconventional global headers and global footers to limit the leakage.Such high V_(T) devices may not cut the leakage to zero. However, highV_(T) devices can at least significantly reduce the leakage. Thisreduction in leakage is particularly the case in comparison to lowthreshold voltage (low V_(T), or LV_(T)) circuits which may be used inthe operational circuits supplied by the header or footer.Conventionally, either a global header or a global footer is used, sincea combination of global headers and global footers is redundant andprovides no substantial benefit. Also, the additional headers/footerscan further increase the area and cost of the circuit.

Additionally, conventional systems that use a global header or footercan be undesirable because the global header/footer acts like aresistance in series. Accordingly, each time the conventional circuitdraws a current, the current passes through the header/footer, which isequivalent to being a resistor in series, thereby reducing efficiencyand performance of the circuit. Thus, instead of having Vdd/Vss directlysupplied to the circuit, the header circuit is turned on and charged,which can result in an increase in the overall power consumption duringoperation, as the global header/footer is scaled to supply largecurrents drawn by many circuit elements coupled to the globalheader/footer.

Additionally, a conventional system that uses a global header or footermay have substantial voltage/current spikes resulting from turning onthe large global header/footer needed for the circuits to becoupled/decoupled to the power supply. Thus, some conventional systemsuse different ways to turn on the global header/footer to avoid spiking.For example, some conventional systems turn on the header/footer usingan intermediary device to ramp up the voltage to avoid spikes and noisespikes at Vdd and VVdd. This can take a few cycles depending on thecircuit configuration and further increases the overall systemcomplexity. This conventional method is also undesirable because thereis a wake-up time associated with this method.

For at least the foregoing reasons, the conventional global headers orfooters can be expensive to implement, and can degrade performancesignificantly. Other conventional systems which use two power sources(i.e., one power source for high V_(T) devices and another power sourcefor low V_(T) devices) are not practical or desirable because suchconfigurations dramatically increase the cost of the circuit design, forexample, in terms of area, complexity, having multiple power grids, etc.

Other conventional systems use high V_(T) devices to try to limit orreduce leakage, since such devices require substantially greater voltageto turn on, and thus, may leak less than low V_(T) or regular thresholdvoltage devices. However, the performance of high V_(T) devices can besubstantially lower than low V_(T) or regular V_(T) devices. Although,if performance is not an issue for a particular application, a highV_(T) device may be suitable. Further, high V_(T) devices do not workvery well (i.e., satisfactorily) at low voltage because of the higherthreshold voltage. Once the voltage is lowered, the devices do not workvery well, if at all. Thus, high V_(T) devices may not be a practicalalternative for reducing or limiting leakage, in many (if not, most)applications.

For at least the reasons set forth above, conventional global headersand footers can be very expensive and require an additional (ordedicated) control signal to be connected to numerous locations in thecircuit design, which increases the cost, for example, in terms of areaoccupied by the circuit on the IC. Such conventional designs also canincrease the cost with respect to the performance of the IC, forexample, by reducing the speed of the circuit and reducing performance.

Accordingly, there is a need for a method and system for reducingleakage while maintaining performance of a circuit.

SUMMARY

Exemplary embodiments of the invention are directed to systems andmethods for reducing leakage current in circuit design, and morespecifically, to methods and systems for reducing leakage current whilemaintaining the performance of the circuit.

In one embodiment, a circuit for reducing leakage is disclosed. Thecircuit can comprise a first portion and a second portion. The firstportion can be configured to operate at a substantially greateroperating frequency than an operating frequency of the second portion.The second portion can comprise a local power block configured todecouple the second portion if the second portion is inactive.

In another embodiment, a circuit can comprise a first portion and asecond portion. The second portion can comprise a local power blockconfigured to decouple the second portion in response to a controlsignal input to the second portion. The control signal can be apre-existing signal configured to control the operation of the secondportion.

In another embodiment, a method of reducing leakage in a circuit having,for example, a first portion and a second portion, is disclosed. Themethod can comprise providing a local power block configured to decouplethe second portion if the second portion is inactive, and decouplingpower to the second portion using the local power block in response to acontrol signal input to the second portion. The control signal can be apre-existing signal configured to control the operation of the secondportion.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are presented to aid in the description ofembodiments of the invention and are provided solely for illustration ofthe embodiments and not limitation thereof.

FIG. 1 is a schematic illustrating a conventional inverter circuit.

FIG. 2 is a schematic illustrating one embodiment of a circuit having alocal power block configured to decouple a second portion operating at alow operating frequency.

FIG. 3 is a schematic illustrating another embodiment of a circuithaving a local power block configured to decouple a second portionoperating at a low operating frequency.

FIG. 4 is a schematic illustrating another embodiment of a circuithaving a local power block configured to decouple a second portionoperating at a low operating frequency.

FIG. 5 is a schematic illustrating another embodiment of a circuithaving a local power block configured to decouple a second portionoperating at a low operating frequency.

FIG. 6 is a flow diagram illustrating an embodiment of a method ofreducing leakage in a circuit.

DETAILED DESCRIPTION

Aspects of the invention are disclosed in the following description andrelated drawings directed to exemplary embodiments of the invention.Alternate embodiments may be devised without departing from the scope ofthe aspects of the invention. Additionally, well known elements of theembodiments of the invention will not be described in detail or will beomitted so as not to obscure the relevant details of the exemplaryembodiments of the invention.

The word “exemplary” is used herein to mean “serving as an example,instance, or illustration.” Any embodiment described herein as“exemplary” is not necessarily to be construed as preferred oradvantageous over other embodiments. Likewise, the terms “embodiments”or “embodiments of the invention” does not require that all embodimentsof the invention include the discussed feature, advantage or mode ofoperation.

The exemplary embodiments recognize and/or account for the distinctionsbetween portions of a circuit operating at a low operating frequency andportions of the circuit operating at a high operating frequency. Forexample, one embodiment can include a circuit having a first and secondportion. The embodiment can further include a local power block (e.g., alocal header or local footer) configured to decouple only those portionsof the circuit that are not high performance (i.e., portions of thecircuit that are configured to operate at a low operating frequency orthat are configured for lower activity), instead of having a globalheader or footer for all parts of the circuit.

The local power block can decouple the portion of the circuit configuredto operate at a low operating frequency when it is inactive by, forexample, interrupting the path from Vdd to the circuit, or from thecircuit to ground. The local power block can be, for example, a localheader or local footer, or other device for establishing a voltageblock. For example, a local header circuit can block a voltage potentialbetween Vdd and an artificial reference (e.g., VVdd), while a localfooter circuit can block a voltage potential between Vss and anartificial reference (e.g., VVss).

FIG. 2 illustrates one embodiment of a circuit 200 having at least afirst portion 202 and a second portion 204. The first portion 202 can beconfigured to operate at a substantially greater operating frequency(e.g., a higher performance portion) than the operating frequency of thesecond portion 204 (e.g., a lower performance portion). The secondportion 204 can have a local power block 208 (e.g., a local header)configured to decouple the second portion 204 if the second portion 204is inactive to reduce leakage current associated with the second portion204 without sacrificing performance of the first portion 202, which isconfigured to operate at the substantially greater operating frequencythan the second portion 204.

In another embodiment, the circuit 200 can have at least the firstportion 202 and the second portion 204. In this embodiment, the secondportion 204 can have a local power block 208 (e.g., a local header)configured to decouple the second portion 204 in response to a controlsignal (not shown) input to the second portion 204. In this embodiment,the control signal can be a pre-existing signal configured to controlthe operation of the second portion 204.

FIG. 2 also exemplarily illustrates a third portion of the circuit 206,which can be configured to operate at a low operating frequency. Thethird portion 206 can have another local power block 210 (e.g., a localheader) configured to decouple the third portion 206 if the thirdportion 206 is inactive to reduce leakage current associated with thethird portion 206 without sacrificing performance of the first portion202, which can be configured to operate at the substantially greateroperating frequency than the third portion 206. In another exemplaryembodiment, the local power block (e.g., 208 or 210) can be shared amongtwo or more portions (e.g., 204, 206) which are configured to operate ata low operating frequency.

As another example, FIG. 3 illustrates an embodiment of a circuit 300having at least a first portion 302 and a second portion 304. The firstportion 302 can be configured to operate at a substantially greateroperating frequency than the operating frequency of the second portion304. The second portion 304 can have a local power block 308 (e.g., alocal footer) configured to decouple the second portion 304 if thesecond portion 304 is inactive to reduce leakage current associated withthe second portion 304 without sacrificing performance of the firstportion 302, which can be configured to operate at the substantiallygreater operating frequency than the second portion 304.

In another embodiment, the circuit 300 can have at least the firstportion 302 and the second portion 304. In this embodiment, the secondportion 304 can have a local power block 308 (e.g., a local footer)configured to decouple the second portion 304 in response to a controlsignal (not shown) input to the second portion. In this embodiment, thecontrol signal can be a pre-existing signal configured to control theoperation of the second portion 304. Examples of using a pre-existingsignal to control the local power block will be provided in thefollowing discussion of FIGS. 4 and 5.

FIG. 3 also illustrates a third portion of the circuit 306, which can beconfigured to operate at a low operating frequency. The third portion306 can have another local power block 310 (e.g., a local footer)configured to decouple the third portion 306 if the third portion 306 isinactive to reduce leakage current associated with the third portion 306without sacrificing performance of the first portion 302, which can beconfigured to operate at the substantially greater operating frequencythan the third portion 306. In another exemplary embodiment, the localpower block (e.g., 308 or 310) can be shared by two or more portions(e.g., 304, 306) which can be configured to operate at a low operatingfrequency.

In one aspect of the embodiments illustrated in FIGS. 2 and 3, the localpower block (e.g., 208, 210, 308, 310) can receive a control signal (notshown) input for controlling operation of the second portion 204, 304.The local power block can be configured to decouple the second portion204, 304 and the third portion 206, 306 in response to the controlsignal input to the second portion 204, 304.

In another embodiment, the local power block can be configured todecouple the second portion 204, 304 and/or the third portion 206, 306in response to a pre-existing control signal (not shown) input to thesecond portion 204, 304 and/or the third portion 206, 306 for a designedoperation of the second portion 204, 304 and/or the third portion 206,306. This can include, for example, a signal that is already used tocontrol the second portion 204, 304 and/or the third portion 206, 306irrespective of whether the local power block is present in the circuit.Accordingly, no additional control signals will need to be generated orrouted.

The embodiments are not limited to the arrangement illustrated in FIGS.2 and 3. Other exemplary embodiments include local header/footers forsequential circuits, for example, a latch or a flip-flop, which havescan-based circuitry associated with them. Examples of these embodimentsare illustrated in FIGS. 4 and 5 and will be described below.

FIG. 4 illustrates a latch circuit 400 (e.g., a latch) having afunctional latch portion 402, a scan flip-flop portion 404, and a scanout portion 406. FIG. 5 illustrates a similar latch circuit 500 having afunctional latch portion 502, a scan flip-flop portion 504, and a scanout portion 506. The scan flip-flop portion 404, 504 and the scan outportion 406, 506 may be used during testing of the device, or during ascan operation. For example, a scan or test operation is performed onthe latch circuit 400, 500 at the foundry to determine if the latchcircuit 400, 500 is operating properly prior to shipping from thefoundry. After the latch circuit 400, 500 is shipped, the circuitryassociated with the scan or test operation (e.g., the scan flip-flopportion 404, 504 and the scan out portion 406, 506) may no longer beused.

In the embodiments of FIGS. 4 and 5, the functional latch portion 402,502 can serve a dual use or purpose in the latch circuit 400, 500 toconserve resources. The functional latch portion 402, 502 can have aninput in port (a) and a data out port (q). For scanning operations, thescan flip-flop portion 404, 504 can be the master circuit, and thefunctional latch portion 402, 502 can be the slave circuit. Duringnormal operation (e.g., not in a test/scan mode), the scan flip-flopportion 404, 504 and the scan out portion 406, 506 may not be used(i.e., configured to be inactive). Instead, only the functional latchportion 402, 502 may be configured to operate.

As a practical matter, the scan flip-flop portion 404, 504, thefunctional latch 402, 502, and the scan out portion 406, 506 may leak,even when these portions are not active (i.e., turned off). It isdesirable to reduce such leakage in the example illustrated in FIGS. 4and 5, in which the scan flip-flop portion 404, 504 and/or the scan outportion 406, 506 may not be used at all after the circuit is tested andthe device has shipped from the foundry. That is, even though the scanflip-flop portion 404, 504 and the scan out portion 406, 506 may not beused after the device is shipped from the foundry, the scan flip-flopportion 404, 504 and the scan out portion 406, 506 of the circuit mayleak, along with the functional latch 402, 502, whenever the circuit issupplied with power. Thus, leakage through the scan flip-flop 404, 504and the scan out portion 406, 506 can result in a substantial amount ofpower leakage, and can account for a significant portion of the overallpower consumed by the IC, even though these portions of the circuit mayno longer be used.

When the device is not in the scan mode, the functional latch portion402, 502 receives data from the data port a, and outputs data from thedata port q. The functional latch portion 402, 502 can be optimized forperformance because this portion can be used to carry out the functionof the circuit. For example, one embodiment can use low V_(T) devices inthe functional latch portion 402, 502 to maximize performance. To reduceor minimize leakage in the scan flip-flop portions, an embodiment canuse regular V_(T) devices in the scan flip-flop portion 404, 504. It isnoted that, while high V_(T) devices can be used to minimize or reduceleakage even further, these high V_(T) devices can compromise circuitoperation at low voltages.

In the embodiment of FIG. 4, a local footer 408 (circled device) can beused as the local power block to reduce leakage. The local footer 408can be configured to be coupled to the scan flip-flop portion 404 toswitch off the Vss supply, thereby creating a virtual Vss (VVss) usedfor portions 404 and 406.

The embodiment illustrated in FIG. 4 can have a local and dedicatedpower block (e.g., local footer 408) to the scan flip-flop portion 404and the scan out portion 406. Thus, by adding a single device 408 thatis configured to decouple only the scan flip-flop portion 404 and/or thescan out portion 406, the size of the device 408 can be scaled so thatthe effect on the area of the circuit 400 is reduced. Moreover, the sizeof the local power block (e.g., local footer 408) can be minimizedbecause it does not have to drive a large load. Instead, the local powerblock (e.g., local footer 408) can be dedicated only to the scanflip-flop portion 404 and/or the scan out portion 406.

The embodiment is not limited to a local power block (e.g., local footer408) provided at the scan flip-flop portion 404 and the scan out portion406. In another embodiment, first and second local power blocks (e.g.,local footers—not shown) can be coupled to each of the scan flip-flopportion 404 and the scan out portion 406. In the embodiment illustratedin FIG. 4, a local footer 408, which is controlled by the shift signal(sh), can be used at the scan out portion 406 (e.g., S_(out) NAND gate)to decouple the power from the scan flip-flop portion 404. However,embodiments of the invention are not limited to this aspect.

In the example illustrated in FIG. 4, a shift signal (sh) can be used tocontrol the scanning operation. The shift signal (sh) is a known signalused for turning on scanning. The shift signal (sh) is an IC-wide signalavailable for various portions of the circuit. The shift signal (sh)gives the opportunity to store values in each sequential element forwhich a test is being performed for determining functionality of thecircuit. The shift signal (sh) can enable the scan operation through thelatch 402. The scan flip-flop portion 404 can be edge triggered to avoidracing through all of the latches.

The embodiment illustrated in FIG. 4 can take advantage of the shiftsignal (sh) already being an input to the latch circuit 400, as thecontrol signal for controlling the scan operation. The embodiment canhave a local power block (e.g., local footer 408) to decouple the scanflip-flop portion 404 and/or the scan out portion 406 of the circuit400. Instead of tying a local footer 408 to a dedicated control signal,an embodiment can use the shift signal (sh), which is already used atthe scan out portion 406 (e.g., S_(out) NAND gate), to turn the localfooter 408 on and off. That is, the local footer 408 can be controlledby the shift signal (sh), which is already configured to be supplied tothe scan circuitry. Thus, this embodiment can significantly reduce theoccupied area associated with decoupling the scan flip-flop portion 404and the scan out portion 406 of the circuit 400, and hence, thisembodiment can reduce the costs associated with this device.

Thus, the embodiment illustrated in FIG. 4 does not need other (e.g.,special or dedicated) circuitry to control the local footer 408. Sincethe scan flip-flop portion 404 and scan out portion 406 may only be usedduring the scan or test operations, the shift signal (sh) can be used topower (e.g., couple and decouple) the scan flip-flop portion 404 andscan out portion 406. Conventionally, a footer may need a separatecontrol signal to turn on and turn off. However, in this embodiment, theshift signal (sh) can be used to turn the local footer 408 on and offbecause, if the shift signal (sh) is on (i.e., supplied to the localfooter 408), then the scanning procedure is being performed and the scanflip-flop portion 404 and the scan out portion 406 are coupled to thepower source via the local footer 408. On the other hand, if the shiftsignal (sh) is off, then the scanning procedure is not being performedand the scan flip-flop portion 404 and the scan out portion 406 can bedecoupled from the power source via the local footer 408. Thus, thelocal footer 408 can be powered up only during scanning and theembodiment illustrated in FIG. 4 does not need another signal to controlit.

The shift signal (sh) is a static signal throughout the scan operation(i.e., it will not be turned on and off). Thus, the local footer 408 canbe switched on to connect the scan flip-flop portion 404 and the scanout portion 406 to ground during the scan operation. When the scanoperation is not being performed, the shift signal (sh) can be off, andthus, the local footer 408 can be switched off and the scan flip-flopportion 404 and scan out portion 406 can be decoupled from the ground,thereby reducing or limiting any leakage through the scan flip-flopportion 404 and scan out portion 406.

In addition, since the shift signal (sh) is a static signal (i.e., theshift signal (sh) does not toggle during the scan procedure), the localfooter 408 can be a long channel device, a high V_(T) device, etc., inorder to further minimize leakage. Since the scan flip-flop portion 404and scan out portion 406 may not be used after the scanning procedure isperformed, the performance of the scan flip-flop portion 404 and scanout portion 406 will not impact operating performance.

The embodiment of FIG. 4 further can reduce leakage by coupling the testclock inverter 412 to the virtual supply node VVss. In thisconfiguration, in the inactive state ckt is low and nckt will be high,rather than floating. Since the state of nckt will be stable, thecircuit can be prevented from operating incorrectly, while stillreducing leakage. Clock inverter 410 is not coupled to the virtualsupply node, so there is no impact on clock inverter 410.

In the embodiment of FIG. 5, a local header 508 (circled device) can beused as the local power block to reduce leakage. The embodimentillustrated in FIG. 5 can add a local and dedicated power block (e.g.,local header 508) to the scan flip-flop portion 504 and the scan outportion 506 to switch off the Vdd supply, thereby creating a virtual Vdd(VVdd) used for portions 504 and 506. Thus, by adding a single device508 configured to decouple only the scan flip-flop portion 504 and/orthe scan out portion 506, the size of the device 508 can be minimized sothat the effect on the area of the circuit 500 can be reduced. Moreover,the size of the local power block (e.g., local header 508) can beminimized because it does not have to drive a large load. Instead, thelocal power block 508 can be dedicated only to the scan flip-flopportion 504 and/or the scan out portion 506.

Embodiments of the invention are not limited to a local power block(e.g., local header 508) provided at the scan flip-flop portion 504 andscan out portion 506. In another embodiment, a second local power block(e.g., a local header or footer—not shown) can be coupled to the scanflip-flop portion 504. In the embodiment illustrated in FIG. 5, a localheader 508, which is controlled by a not-shift (nsh) signal, can be usedat the Sout NOR gate to establish a local virtual supply node (e.g.,VVdd) and decouple the power from the scan flip-flop portion 504 and thescan out portion 506. However, the embodiment is not limited to thisaspect.

The embodiment illustrated in FIG. 5 can take advantage of the not-shift(nsh) signal already being an input to the latch circuit 500, as thecontrol signal for controlling the scan operation. Instead of tying alocal header 508 to a dedicated control signal, an embodiment can usethe not-shift signal (nsh), which is already used at the Sout NOR gate,to turn the local header 508 on and off. That is, the local header 508can be controlled by a signal which is already being supplied to thescan circuitry. Thus, this embodiment can reduce the occupied areaassociated with decoupling the scan flip-flop portion 504 and the scanout portion 506 of the circuit 500, and hence, the costs associated withthis device.

The embodiment illustrated in FIG. 5 may not need other (e.g., specialor dedicated) circuitry to control the local header 508. Since the scanflip-flop portion 504 and scan out portion 506 may only be used duringthe scan or test operations, the not-shift signal (nsh) can be used topower (e.g., couple and decouple) the scan flip-flop portion 504 and/orscan out portion 506. If the not-shift signal (nsh) is off, then thescanning procedure is not being performed and the scan flip-flop portion504 and the scan out portion 506 can be decoupled from the power sourcevia the local header 508, thereby reducing or limiting any leakagethrough the scan flip-flop portion 504 and/or scan out portion 506.

In contrast to the embodiment of FIG. 4, the embodiment illustrated inFIG. 5 does not couple the test clock inverter 512 to the virtual powersupply node. The inverter 512 is not coupled to the virtual power supplynode because with the input (ckt) to inverter 512 low in the inactivestate, the output of the inverter 512 would be floating, which couldnegatively impact the operation of the functional latch 502. Further, asin FIG. 4, clock inverter 510 is not coupled to a virtual power supply.

As mentioned above, scan circuits may only be used to test or scan anIC, or portions thereof, before the IC leaves the foundry to determineif the IC is operating properly. The scan circuits may not be for designoperations. These scan circuits may not be used again after the IC isshipped from the foundry, and therefore, the performance of the scan ortest circuits is not a priority in the circuit design. Accordingly, thescan circuits can be configured to operate at a lower operatingfrequency than the functional latch portions of the circuit.

In some applications, each sequential element of a circuit can have ascan portion. The scan circuits can be half the size of each latch,which accounts for a large portion of the IC area. For example, an ICcan include thousands of latches, which can account for 25% of the ICarea. Thus, half of this area can be the scan circuits of the latches,which can account for a significant area of the circuit and asignificant source of leakage. Even though the scan portions of eachlatch may not be used for field operation, the scan portions can leakbecause they are coupled to VDD. That is, even though invertors,cascades, gated inverters, etc. can be turned off, they can still leak.Thus, if the leakage from the scan portions of the latches can beprevented or limited, the overall leakage of the IC can be significantlyreduced.

In other words, the functional latch 402, 502, the scan flip-flopportion 404, 504, and the scan out portion 406, 506 may leak even whenthese portions are not active (i.e., turned off). It is desirable toreduce such leakage in the example illustrated in FIGS. 4 and 5, inwhich the scan flip-flop portion 404, 504 and the scan out portion 406,506 may not be used at all after the circuit is tested and the devicehas shipped from the foundry. That is, even though the scan flip-flopportion 404, 504 and the scan out portion 406, 506 may not be used(i.e., may not be configured to operate) after the device is shippedfrom the foundry, the scan flip-flop portion 404, 504 and the scan outportion 406, 506 of the circuit can leak whenever the circuit issupplied with power. Thus, leakage through the scan flip-flop 404, 504and the scan out portion 406, 506 can result in a substantial amount ofpower leakage, and can account for a significant portion of the overallpower consumed by the IC, even though these portions of the circuit mayno longer be used.

In the embodiments illustrated in FIGS. 2-5, the local power block canbe configured to reduce or avoid the impact on the functional portion ofthe circuit (e.g., the first portion 202, 302 illustrated in FIGS. 2 and3, and the latch 402, 502 illustrated in FIGS. 4 and 5). Thus, theembodiments can reduce or limit any degradation in the performance ofthe first portion (i.e., functional portion). On the other hand, thescan portion of the circuit can be designed for lower performance (e.g.,operating frequency). Thus, one embodiment can have a small, longchannel, local power block (e.g., local footer) for significantlyreducing leakage in the scan portion of the circuit. The local powerblock can be reduced in size as compared to a global header or footerand may even be formed from a minimum sized device (e.g., transistor)based on the configuration of the second portion which is beingdecoupled.

Another embodiment can include a method 600, as exemplarily illustratedin FIG. 8, of reducing leakage in a circuit having a first portion(e.g., 202, 302, 402, 502) and a second portion (e.g., 204, 304, 404,504). The method 600 can include, in block 602, providing a local powerblock (e.g., 208, 308, 408, 508), configured to decouple the secondportion, if the second portion is inactive. The method 600 can furtherinclude, in block 604, decoupling power to the second portion using thelocal power block in response to a control signal (e.g., shift (sh),not-shift (nsh)) input to the second portion. In one embodiment, thecontrol signal can be a pre-existing signal configured to control theoperation of the second portion. In a further embodiment, the localpower block can be a device that both decouples the power to the secondportion and functionally operates in the second portion. For example,transistor 408 in the NAND gate of 406 and transistor 508 in the NORgate of 506 both function as local power blocks and as part of therespective gates. Accordingly, no additional devices are needed in therespective circuits.

Further aspects of the embodiments disclosed above will now be describedwith reference to the exemplary embodiments illustrated in FIGS. 4 and5. It can be seen that each of the illustrated latch circuits (e.g.,400, 500) has eleven portions A, B, C, D, E, F, G, H, I, J, and Kforming the circuit. In the embodiments of FIGS. 4 and 5, portions A, B,C, D, E, and G of each circuit can be associated only with performingthe scan operation (e.g., 404, 406 and 504, 506), while four portions H,I, J, and K of each circuit can be associated with the latch portion(e.g., 402, 502).

As can be seen in the examples illustrated in FIGS. 4 and 5, if aconventional global footer or a global header is configured to couple oruncouple the voltage supply to all of the eleven portions A, B, C, D, E,F, G, H, I, J, and K of the circuit, a global header/footer of asubstantial size and a substantial capacity will be needed for alleleven portions. Also, such global headers and footers can affect ordegrade the performance of the circuit. Alternatively, if the effect onperformance is to be reduced, then a global header or footer is not usedand all eleven portions of the circuit may leak, including the scanportions, which may not be configured to be used after the scanoperations are performed (i.e., after the IC is tested and shipped fromthe foundry).

In comparison, the exemplary embodiments of the latch circuit 400, 500illustrated in FIGS. 4 and 5 can reduce or eliminate the effect ofleakage on the overall performance of the circuit 400, 500. In the latchcircuit 400, 500 illustrated in FIGS. 4 and 5, the leakage through theseven portions A, B, C, D, E, and G (in 400) of the circuit 400, 500,which can be used for scanning (e.g., the portions of the scan flip-flop404, 504 and the scan output 406, 506), can be substantially reduced oreliminated by the local power block (e.g., local footer 408, localheader 508). This can result in a substantial reduction in currentleakage, while minimizing or avoiding any reduction in the performanceof the functional part of the circuit 400, 500. Only, the portions G (in500), H, I, J, and K of the circuits 400, 500 associated with thefunctional latches 402, 502 will have their leakage unaffected. Thus,the leakage through the latch circuit 400, 500 illustrated in FIGS. 4and 5 is substantially reduced compared to the leakage in conventionallatch circuits.

The embodiments are not limited to latch or scan mode circuitry. Otherembodiments can be applied to any circuit that has one or more highperformance portions and one or more low performance portions for a lowactivity mode, which may be mutually exclusive from the functional modeof the high performance portions.

The difference between high performance and low performance portions ofthe circuit may depend on several factors, for example, the technologyinvolved, the configuration of the circuits, whether a circuit is in acritical processing path, etc. In some embodiments, high performanceportions may be determined based on the circuits that dictate theoverall performance of the IC; for example, critical path/pass circuitsthat limit the speed of the overall IC. On the other hand, the lowperformance portions of the circuit can be defined as those portions ofthe circuit, such a scan circuitry, which have little or no impact onthe performance of the overall IC or are inactive during normaloperation (e.g., test circuits), but still can impact the overall powerconsumption of the IC. For example, in the circuits illustrated in FIGS.4 and 5, the operation of the functional latch 402, 502 can impact thefrequency response/performance during normal operation, while the scanportion (e.g., scan flip-flop portion 404, 504 and scan out portion 406,506) is only used for testing purposes, but still can impact the powerconsumption of the IC.

The embodiments are not limited to the arrangements illustrated in FIGS.2-6. Other embodiments can have one or more portions of the circuit thatare configured to operate at a higher operating frequency than one ormore portions of the circuit that are configured to operate at a loweroperating frequency. In other embodiments, the local power block can beone or more local headers/footers for one or more lower performanceportions. The selection of the local header or local footer can be basedon the configuration of the circuit and/or portions of the circuit towhich the local power block is being used to decouple the power source.

In a circuit configured to have a higher performance path (e.g.,configured to operate at a higher operating frequency), it is desirableto avoid or reduce the reduction in performance, for example, associatedwith using a global header or a global footer to minimize leaking.However, reducing leakage for lower performance portions of the circuitis desirable. Thus, the embodiments can configure the circuit such thata higher performance portion (or portions) of the circuit can beconnected directly to the voltage supply, in order to minimize or limita reduction in performance of the higher performance portion (orportions) of the circuit. The lower performance portion (or portions) ofthe circuit can have a local power block (e.g., a local header or localfooter) to minimize leaking from the lower performance portion (orportions) of the circuit. Thus, the embodiments can selectively have alocalized power block (e.g., a local header or a local footer)configured to be coupled only to a lower performance portion of thecircuit, instead of a global header coupled to all portions (e.g.,higher performance portions and lower performance portions) of thecircuit.

In embodiments having more than one lower performance portion, eachlower performance portion can have a localized power block or multipleportions can share a common local power block. Design considerations forselecting a common local power block for multiple low performanceportions can include the availability of an existing control signal toactivate/deactivate the common local power block, an existing device toserve as the local power block (e.g., a NAND gate transistor in FIG. 4),the total current switched and the proximity of the portions the lowerperformance portions. Thus, the physical size and configuration of eachlocalized power block can be designed to reduce the area used, costs andpower consumed because each localized power block can serve only thelower performance portion (or portions) of the circuit for which it isconfigured to decouple from the power source.

Embodiments of the invention reduce performance variations, for example,resulting from using a global header or footer that decouples power tothe higher performance portion (or portions) of the circuit, while stillreducing leakage in the lower performance portions of the circuit. Thehigher performance portion (or portions) of the circuit may leak, sincethe higher performance portion (or portions) does not have a localheader or local footer. However, the leakage of the lower performanceportions of the circuit can account for a significant portion of theoverall leakage, and thus, can be a considerable portion of the powerloss by the circuit.

It should be appreciated that information and signals may be representedusing any of a variety of different technologies and techniques. Forexample, data, instructions, commands, information, signals, bits,symbols, and chips that may be referenced throughout the abovedescription may be represented by voltages, currents, electromagneticwaves, magnetic fields or particles, optical fields or particles, or anycombination thereof.

While the foregoing disclosure shows illustrative embodiments of theinvention, it should be noted that various changes and modificationscould be made herein without departing from the scope of the inventionas defined by the appended claims. The functions, steps and/or actionsof the method claims in accordance with the embodiments of the inventiondescribed herein need not be performed in any particular order.Furthermore, although elements of the invention may be described orclaimed in the singular, the plural is contemplated unless limitation tothe singular is explicitly stated.

1. A circuit comprising: a first portion; and a second portion, whereinthe first portion is configured to operate at a substantially greateroperating frequency than an operating frequency of the second portion,and wherein the second portion comprises a local power block configuredto decouple the second portion if the second portion is inactive.
 2. Thecircuit according to claim 1, wherein the local power block isconfigured to decouple the second portion in response to a controlsignal input to the second portion.
 3. The circuit according to claim 2,wherein the control signal is a pre-existing signal configured tocontrol the operation of the second portion.
 4. The circuit according toclaim 1, wherein the local power block comprises a local header circuit.5. The circuit according to claim 4, wherein the second portioncomprises a scan flip-flop circuit, and wherein the first portioncomprises a functional latch circuit.
 6. The circuit according to claim5, wherein the local header circuit is configured to decouple the scanflip-flop circuit in response to a not-shift signal supplied to the scanflip-flop circuit for performing a scanning procedure for testingoperation of the circuit.
 7. The circuit according to claim 1, whereinthe local power block comprises a local footer circuit.
 8. The circuitaccording to claim 7, wherein the second portion comprises a scanflip-flop circuit, and wherein the first portion comprises a functionallatch circuit.
 9. The circuit according to claim 8, wherein the localfooter circuit is configured to decouple the scan flip-flop circuit inresponse to a shift signal supplied to the scan flip-flop circuit forperforming a scanning procedure for testing operation of the circuit.10. The circuit according to claim 1, wherein the local power block isan element in the circuit that is configured to both function as thelocal power block and to perform an operational function in the secondportion.
 11. A processor including a sequential circuit, the sequentialcircuit comprising: a first portion; and a second portion, wherein thesecond portion comprises a local power block configured to decouple thesecond portion in response to a control signal input to the secondportion, and wherein the control signal is a pre-existing signalconfigured to control the operation of the second portion.
 12. Theprocessor according to claim 11, wherein the first portion is configuredto operate at a substantially greater duty cycle than a duty cycle ofthe second portion.
 13. The processor according to claim 11, wherein thefirst portion is configured to operate at a substantially greateroperating frequency than an operating frequency of the second portion.14. The processor according to claim 11, wherein the local power blockcomprises a local header circuit.
 15. The processor according to claim14, wherein the second portion comprises a scan flip-flop circuit, andwherein the first portion comprises a functional latch circuit.
 16. Theprocessor according to claim 15, wherein the pre-existing signalcomprises a not-shift signal.
 17. The processor according to claim 11,wherein the local power block comprises a local footer circuit.
 18. Theprocessor according to claim 17, wherein the second portion comprises ascan flip-flop circuit, and wherein the first portion comprises afunctional latch circuit.
 19. The processor according to claim 18,wherein the pre-existing signal comprises a shift signal.
 20. Theprocessor according to claim 1, wherein the local power block is anelement in the sequential circuit that is configured to both function asa the local power block and to perform an operational function in thesecond portion.
 21. A method of reducing leakage in a circuit having afirst portion and a second portion, the method comprising: providing alocal power block configured to decouple the second portion if thesecond portion is inactive; and decoupling power to the second portionusing the local power block in response to a control signal input to thesecond portion, wherein the control signal is a pre-existing signalconfigured to control the operation of the second portion.
 22. Themethod according to claim 21, wherein the local power block is a devicethat both decouples the power to the second portion and functionallyoperates in the second portion.